Abstract: Fabric defect classification is crucial in textile quality inspection, enabling category-specific defect handling. Although dozens of defect categories have been defined, annotation ...

This project explores the use of Convolutional Neural Networks (CNNs) for semiconductor wafer defect pattern classification using the WM-811k dataset. Defect pattern recognition is critical in ...

Abstract: Small surface defects in automotive manufacturing, such as micro-cracks, springbacks, and minor deformations, typically appear in highly curved or reflective regions of large and complex ...

A desktop application and deep learning pipeline for classifying semiconductor wafer defects from grayscale microscopy images. Built for the Intel Semiconductor Solutions Challenge 2026, this system ...

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...

Extract semantic information via classification Defect type based on what is the nature of the change required to correct the defect A measurement system’s characteristics: ...