Integrating deep learning in optical microscopy enhances image analysis, overcoming traditional limitations and improving classification and segmentation tasks.

The optimized detection model is integrated into both a mobile application and a dedicated edge device, demonstrating that real-time waste detection can operate reliably without cloud connectivity.

Security researchers have devised a technique to alter deep neural network outputs at the inference stage by changing model weights via row hammering in an attack dubbed ‘OneFlip.’ A team of ...